tests: Bluetooth: Tester: Fix issues with ISO tests #99408
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Add board file for nrf5340_audio_dk_nrf5340_cpuapp identical to the ones for nrf5340dk_nrf5340_cpuapp Signed-off-by: Emil Gydesen <[email protected]>
The ISO buffers defaults to 1, but since there are risks that the ISO RX events cannot be sent to the upper tester via UART before the next RX, the RX is increased. This also allows to better support cases where the ISO interval is larger than the SDU interval. The ISO TX buffers are similarly increase to help prevent cases where a TX isn't scheduled. Signed-off-by: Emil Gydesen <[email protected]>
Modify the timeout from 10ms to 100us. The reason for this is that the UART can only hold 4 octets at a time, which cases events larger than 4 octets to require multiple timeout before the entire event can be sent. This solution is mostly a workaround and has the purpose of increasing the performance and help prevent the tests from failing due to the low speed caused by this. A proper solution would likely be to switch to the async UART API instead. Signed-off-by: Emil Gydesen <[email protected]>
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area: Tests
zephyrbot
requested review from
HaavardRei,
HoZHel,
JarmouniA,
PavelVPV,
alwa-nordic,
cvinayak,
hermabe,
jhedberg,
kartben,
nashif and
sjanc
cvinayak
approved these changes
Nov 14, 2025
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Fixes some issues with the ISO and Audio tests for the BT Tester, as data was dropped due to low buffers and slow speed.