a) Cleaning
Usually, samples are cleaned before annealing, is it necessary in this case ?
b) Process
- Ramp from RT 110 C, ramp rate of 1.5 C/min.
- Hold at 110 C for 12 hours.
- Ramp down to RT (can be faster than ramp up).
c) Location
Garret raised the possibility of annealing inside the bonder. Should we perform annealing in LMA oven or inside the bonding tool (to limit the risks associated with transportation)? Is annealing part of the FAT?
d) Interrogations
Can a difference between GaAs and SiO2 CTE (coefficient of thermal expansion) induce mechanical stress leading to cracks or delamination ? This phenomenon increases with the surface of bonding. Is it part of the FAT?
a) Cleaning
Usually, samples are cleaned before annealing, is it necessary in this case ?
b) Process
c) Location
Garret raised the possibility of annealing inside the bonder. Should we perform annealing in LMA oven or inside the bonding tool (to limit the risks associated with transportation)? Is annealing part of the FAT?
d) Interrogations
Can a difference between GaAs and SiO2 CTE (coefficient of thermal expansion) induce mechanical stress leading to cracks or delamination ? This phenomenon increases with the surface of bonding. Is it part of the FAT?